Algorithms in FastImp: a fast and wide-band impedance extraction program for complicated 3-D geometries

Author

Zhu, Zhenhai ; Song, Ben ; White, Jacob K.

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Massachusetts Inst. of Technol., Cambridge, MA, USA

Volume

24

Issue

7

fYear

2005

fDate

7/1/2005 12:00:00 AM

Firstpage

981

Lastpage

998

Abstract

In this paper, we describe the algorithms used in FastImp, a program for accurate analysis of wide-band electromagnetic effects in very complicated geometries of conductors. The program is based on a recently developed surface integral formulation and a precorrected fast Fourier transform (FFT) accelerated iterative method, but includes a new piecewise quadrature panel integration scheme, a new scaling and preconditioning technique as well as a generalized grid interpolation and projection strategy. Computational results are given on a variety of integrated circuit interconnect structures to demonstrate that FastImp is robust and can accurately analyze very complicated geometries of conductors.

Keywords

circuit analysis computing; computational electromagnetics; conductors (electric); fast Fourier transforms; integral equations; integration; interpolation; iterative methods; 3D conductor geometries; FastImp program; accelerated iterative method; generalized grid interpolation; piecewise quadrature panel integration; preconditioning technique; precorrected fast Fourier transform; scaling technique; surface integral formulation; wide-band electromagnetic effects; wide-band impedance extraction program; Acceleration; Algorithm design and analysis; Conductors; Electromagnetic analysis; Fast Fourier transforms; Geometry; Iterative algorithms; Iterative methods; Surface impedance; Wideband; Fast integral equation solver; panel integration; parasitic extraction; preconditioner; surface integral formulation; wide-band analysis;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/TCAD.2005.847897

Filename

1458927