DocumentCode :
986351
Title :
On the ZBDD-based nonenumerative path delay fault coverage calculation
Author :
Kocan, Fatih ; Gunes, Mehmet H.
Author_Institution :
Comput. Sci. & Eng. Dept., Southern Methodist Univ., Dallas, TX, USA
Volume :
24
Issue :
7
fYear :
2005
fDate :
7/1/2005 12:00:00 AM
Firstpage :
1137
Lastpage :
1143
Abstract :
We devise one exact and one pessimistic path delay fault (PDF) grading algorithms for combinational circuits. The first algorithm, an extension to the basic grading algorithm of Padmanaban, Michael, and Tragoudas (2003), does not store all of the detected PDFs during the course of grading, and, as a further improvement, it utilizes compressed representation of PDFs. These two techniques yield a space-and-time efficient algorithm. To enable grading of circuits with exponential number of paths, a circuit is first partitioned into a set of subcircuits. The second algorithm efficiently calculates the coverage of partitioned circuits. The former algorithm results in 50%-70% reduction in space and a speedup from 1.6 to 2.48 in ISCAS85 benchmarks. The time complexity of the latter algorithm is O(N2) subset operations per test vector where N is the number of nets in the circuit.
Keywords :
circuit analysis computing; circuit complexity; combinational circuits; fault diagnosis; logic partitioning; logic testing; ZBDD; circuit testing; combinational circuits; logic partitioning; logic testing; nonenumerative path delay fault coverage calculation; path delay fault grading algorithms; time complexity; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Data structures; Delay effects; Partitioning algorithms; Sequential analysis; Timing; Very large scale integration; Fault grading; path delay fault (PDF); simulation;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2005.850851
Filename :
1458939
Link To Document :
بازگشت