• DocumentCode
    986511
  • Title

    Intense light ion beam divergence in single- and two-stage diodes

  • Author

    Miyamoto, Sadaaki ; Yasuike, K. ; Shirai, Nobutake ; Imasaki, Kazuo ; Yamanaka, Chiyoe ; Nakai, Sadao

  • Author_Institution
    Inst. of Laser Eng., Osaka Univ., Japan
  • Volume
    21
  • Issue
    5
  • fYear
    1993
  • fDate
    10/1/1993 12:00:00 AM
  • Firstpage
    567
  • Lastpage
    572
  • Abstract
    Two types of beam-extraction intense light ion diodes are investigated. One is a single-stage applied-B ion diode installed on a simple coaxial pulsed power machine. Beam flux and beam divergence angle are measured simultaneously with spatial resolution using an arrayed ion pinhole camera (APC). Measured data show some relation between the distribution of beam divergence and beam flux. This result implies the importance of this type of diagnostics for studying the light ion diode. Experiments with another type of diode, a two-stage ion diode, are performed on an induction adder accelerator. In this diode, the output beam of the first stage is injected into the second-stage diode. The operation of the second diode is controlled by the injected beam. Shadow-box measurements on the two-stage diode indicate an improvement of beam divergence (half width full maximum) from 52±18 mrad to 27±6 mrad due to acceleration at the second diode. This improvement of beam divergence is in agreement with a calculated value using voltages of the first and the second stage diode
  • Keywords
    beam handling equipment; ion beams; particle beam diagnostics; applied-B ion diode; beam divergence angle; beam flux; coaxial pulsed power machine; diagnostics; induction adder accelerator; injected beam; ion diodes; light ion beam divergence; light ion diode; output beam; shadow-box measurements; single-stage diodes; spatial resolution; two-stage diodes; Accelerometers; Cameras; Coaxial components; Diodes; Goniometers; Ion accelerators; Ion beams; Particle beam injection; Particle beams; Spatial resolution;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.249644
  • Filename
    249644