DocumentCode :
986527
Title :
Thermoreflectance calibration procedure on a laser diode: application to catastrophic optical facet damage analysis
Author :
Dilhaire, S. ; Grauby, S. ; Claeys, W.
Author_Institution :
CPMOH-Univ. Bordeaux, Talence, France
Volume :
26
Issue :
7
fYear :
2005
fDate :
7/1/2005 12:00:00 AM
Firstpage :
461
Lastpage :
463
Abstract :
In this letter, we present a thermoreflectance setup specially designed for the study of the temperature variations of the output facet of a laser diode. Indeed, the temperature of the laser diode is controlled by a Peltier element and the device under test is used as a temperature sensor. We propose a calibration procedure based on electrical measurements combined with optical ones; it leads to the determination of thermoreflectance coefficients and then to absolute temperature variations on a running laser diode. We can hence ensure a proper running of the diode and avoid its catastrophic optical facet damage.
Keywords :
calibration; semiconductor lasers; temperature measurement; thermoreflectance; Peltier element; catastrophic optical facet damage analysis; laser diode; semiconductor lasers; temperature measurement; temperature sensor; thermoreflectance calibration; Calibration; Diode lasers; Electric variables measurement; Optical control; Optical design; Optical sensors; Temperature control; Temperature sensors; Testing; Thermoreflectance; Reliability; semiconductor lasers; temperature measurement; thermoreflectance;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2005.851090
Filename :
1458956
Link To Document :
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