DocumentCode :
986596
Title :
Production performance of the ATLAS semiconductor tracker readout system
Author :
Mitsou, Vasiliki A.
Author_Institution :
CSIC, Valencia Univ., Spain
Volume :
53
Issue :
3
fYear :
2006
fDate :
6/1/2006 12:00:00 AM
Firstpage :
729
Lastpage :
734
Abstract :
The ATLAS Semiconductor Tracker (SCT) together with the pixel and the transition radiation detectors will form the tracking system of the ATLAS experiment at LHC. It will consist of 20000 single-sided silicon microstrip sensors assembled back-to-back into modules mounted on four concentric barrels and two end-cap detectors formed by nine disks each. The SCT module production and testing has finished while the macro-assembly is well under way. After an overview of the layout and the operating environment of the SCT, a description of the readout electronics design and operation requirements will be given. The quality control procedure and the DAQ software for assuring the electrical functionality of hybrids and modules will be discussed. The focus will be on the electrical performance results obtained during the assembly and testing of the end-cap SCT modules.
Keywords :
data acquisition; high energy physics instrumentation computing; nuclear electronics; position sensitive particle detectors; quality control; readout electronics; silicon radiation detectors; ATLAS Semiconductor Tracker Readout System module production performance; DAQ software; concentric barrels; end cap silicon transition modules; hybrids electrical functionality; large hadron collider; macro assembly; quality control procedure; readout electronics design; semiconductor tracker operating environment; silicon transition radiation detectors; single sided silicon microstrip sensors; Assembly; Data acquisition; Large Hadron Collider; Microstrip; Production systems; Quality control; Radiation detectors; Readout electronics; Silicon; Testing; ATLAS; data acquisition; quality control; silicon radiation detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2006.874727
Filename :
1644934
Link To Document :
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