Title :
Electro-optic sampling with picosecond resolution
Author :
Kolner, B.H. ; Bloom, D.M. ; Cross, P.S.
Author_Institution :
Hewlett-Packard Laboratories, Palo Alto, USA
Abstract :
The development of an electro-optic sampling system with resolution of better than 2 picoseconds and shot noise limited sensitivity of 11 ¿V/¿Hz is reported. This system has been used to characterise GaAs photodiodes which have exhibited pulsewidths as short as 5.4 picoseconds (full-width-half-maximum).
Keywords :
III-V semiconductors; characteristics measurement; electro-optical devices; gallium arsenide; photodiodes; GaAs photodiodes; electro-optic sampling system; pulsewidths; resolution; shot noise limited sensitivity;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19830391
