DocumentCode
986915
Title
A Global Sensitivity Analysis of Three- and Four-Layer EEG Conductivity Models
Author
Vallaghe, S. ; Clerc, Maureen
Author_Institution
Odyssee Team-Project, Inst. Nat. de Rech. en Inf. et en Autom. (INRIA), Sophia Antipolis
Volume
56
Issue
4
fYear
2009
fDate
4/1/2009 12:00:00 AM
Firstpage
988
Lastpage
995
Abstract
The accuracy of forward models for EEG partly depends on the conductivity values of the head tissues. Yet, the influence of the conductivities on the model output is still not well understood. In this paper, we apply a variance-based sensitivity analysis method to the most common EEG forward models (three or four layers). This method is global because it quantifies the influence of each parameter with all the parameters varying at the same time. With nonlinear models, it helps to understand the interaction between parameters, which is not possible with simple sensitivity analyses (one-at-a-time variations, derivatives, and perturbations). By analyzing the potential topographies at the electrodes, we obtained several results. For a shallow dipole, the EEG topographies are mainly sensitive to the interaction between skull and scalp conductivities. It means that the variability of the EEG topographies is driven mostly by a function of skull and scalp conductivities. Similar results are presented for skull anisotropy and a current injection as performed in electrical impedance tomography. This global sensitivity analysis gives new information about EEG forward models-it identifies the main input parameters that need model refinement-and directions on how to calibrate these models.
Keywords
bioelectric phenomena; biomedical electrodes; electric impedance imaging; electroencephalography; sensitivity analysis; EEG topography; biomedical electrodes; current injection; electrical impedance tomography; four-layer EEG conductivity model; global sensitivity analysis; head tissues; potential topography; scalp conductivity; skull anisotropy; skull conductivity; three-layer EEG conductivity model; variance-based sensitivity analysis; Anisotropic magnetoresistance; Brain modeling; Conductivity; Electrodes; Electroencephalography; Impedance; Scalp; Sensitivity analysis; Skull; Surfaces; Conductivity; EEG; electrical impedance tomography (EIT); sensitivity analysis; variance-based methods; Algorithms; Brain Mapping; Calibration; Computer Simulation; Electric Conductivity; Electroencephalography; Models, Neurological; Sensitivity and Specificity; Signal Processing, Computer-Assisted;
fLanguage
English
Journal_Title
Biomedical Engineering, IEEE Transactions on
Publisher
ieee
ISSN
0018-9294
Type
jour
DOI
10.1109/TBME.2008.2009315
Filename
4671116
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