DocumentCode :
987021
Title :
Measurements of 1/f frequency noise reduction in semiconductor lasers using optical feedback with dispersive loss
Author :
Kitching, J. ; Shevy, Y. ; Iannelli, J. ; Yariv, A.
Author_Institution :
California Inst. of Technol., Pasadena, CA, USA
Volume :
11
Issue :
10
fYear :
1993
fDate :
10/1/1993 12:00:00 AM
Firstpage :
1526
Lastpage :
1532
Abstract :
The authors review the theoretical framework for linewidth reduction in semiconductor lasers using optical feedback with dispersive loss. These results are then applied to lasers having both white and 1/f frequency noise. Experimental confirmation of the dependence of frequency noise on feedback parameters is presented using optical feedback from an external cavity containing Cs vapor. It is shown that such feedback reduces the frequency noise spectrum uniformly within its operating bandwidth. It is also shown that where white noise is dominant, the linewidth is reduced by the same factor, 1/Q2, as the frequency noise spectrum, but, when 1/f noise dominates, the linewidth is reduced only by 1/Q
Keywords :
feedback; optical loss measurement; random noise; semiconductor device noise; semiconductor lasers; spectral line breadth; white noise; 1/f frequency noise reduction; Cs; Cs vapor; dispersive loss; external cavity; feedback parameters; frequency noise; frequency noise spectrum; linewidth reduction; operating bandwidth; optical feedback; review; semiconductor lasers; white noise; Frequency measurement; Laser feedback; Laser noise; Laser theory; Noise measurement; Noise reduction; Optical feedback; Optical noise; Semiconductor device noise; Semiconductor lasers;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/50.249891
Filename :
249891
Link To Document :
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