Title :
Mixed measure error function for nonlinear mapping algorithms
Author_Institution :
University of Glasgow, Department of Electronics & Electrical Engineering, Glasgow, UK
Abstract :
A new mixed measure error function is presented and tested.
Keywords :
error analysis; pattern recognition; cluster structure detection; high-dimensional data set; iterative NLM algorithms; mixed measure error function; nonlinear mapping algorithms; pattern recognition; reference distance set;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19830432