Title : 
Mixed measure error function for nonlinear mapping algorithms
         
        
        
            Author_Institution : 
University of Glasgow, Department of Electronics & Electrical Engineering, Glasgow, UK
         
        
        
        
        
        
        
            Abstract : 
A new mixed measure error function is presented and tested.
         
        
            Keywords : 
error analysis; pattern recognition; cluster structure detection; high-dimensional data set; iterative NLM algorithms; mixed measure error function; nonlinear mapping algorithms; pattern recognition; reference distance set;
         
        
        
            Journal_Title : 
Electronics Letters
         
        
        
        
        
            DOI : 
10.1049/el:19830432