Title :
Syndrome-testable internally unate combinational networks
Author :
Eris, E. ; Miller, D.M.
Author_Institution :
University of Manitoba, Department of Computer Science, Winnipeg, Canada
Abstract :
A combinational network is syndrome-testable with respect to a particular fault if the faulty network realises a function with a different number of ones from the function realised by the fault-free network. Here we investigate the syndrometestability of single stuck-at faults in internally unate combinational networks. We show how such a network can be made syndrome-testable for single stuck-at faults by the addition of a single control line. In the case of a two-level network, at most one additional first-level gate is added to the network.
Keywords :
combinatorial circuits; fault location; logic testing; faulty network; first-level gate; internally unate combinational networks; logic testing; single control line; single struck-at faults; syndrome-testable; two-level network;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19830434