Title :
Performance Analysis of Digital Flight Control Systems With Rollback Error Recovery Subject to Simulated Neutron-Induced Upsets
Author :
Zhang, Hong ; Gray, W. Steven ; González, Oscar R.
Author_Institution :
Old Dominion Univ., Norfolk
Abstract :
This paper introduces a class of stochastic hybrid models for the analysis of closed-loop control systems implemented with NASA´s Recoverable Computer System (RCS). Such systems have been proposed to ensure reliable control performance in harsh environments. The stochastic hybrid model consists of a stochastic finite-state automaton driven by a Markov input process, which in turn drives a switched linear discrete-time dynamical system. Stability and output tracking performance are analyzed using an extension of the existing theory for Markov jump-linear systems. The theory is then applied to predict the tracking error performance of a Boeing 737 at cruising altitude and in closed-loop with an RCS subject to neutron-induced single-event upsets. The results are validated using experimental data obtained from a simulated neutron environment in NASA´s SAFETI Laboratory.
Keywords :
Markov processes; aerospace control; closed loop systems; discrete time systems; stochastic automata; stochastic systems; system recovery; Boeing 737; Markov input process; Markov jump-linear systems; NASA; Recoverable Computer System; SAFETI Laboratory; closed-loop control systems; digital flight control systems; neutron-induced single-event upsets; rollback error recovery; simulated neutron environment; simulated neutron-induced upsets; stochastic finite-state automaton; stochastic hybrid models; switched linear discrete-time dynamical system; Aerospace control; Aerospace simulation; Analytical models; Automatic control; Computational modeling; Computer errors; Control system analysis; Error correction; Performance analysis; Stochastic systems; Aerospace control; Markov jump-linear systems; single-event upsets (SEUs); stochastic automata; stochastic hybrid systems;
Journal_Title :
Control Systems Technology, IEEE Transactions on
DOI :
10.1109/TCST.2007.903079