• DocumentCode
    987623
  • Title

    Evaluation of a Capacitance Scaling System

  • Author

    Avramov-Zamurovic, Svetlana ; Koffman, Andrew D. ; Waltrip, Bryan Cristopher ; Wang, Yicheng

  • Author_Institution
    U.S. Naval Acad., Annapolis
  • Volume
    56
  • Issue
    6
  • fYear
    2007
  • Firstpage
    2160
  • Lastpage
    2163
  • Abstract
    An improved error analysis of an existing capacitance scaling system for supporting measurements of higher valued (10 nF to 100 ) ceramic-dielectric four-terminal-pair (4TP) capacitance standards over the 100-Hz to 100-kHz frequency range is described. The capacitance scaling system uses a commercial impedance (inductance-capacitance-resistance) meter and a single-decade inductive voltage divider as an impedance comparator. Four-terminal-pair capacitors in decade (10 : 1) steps from 10 nF to 100 F are measured. The system´s 10 : 1 scaling error is determined using 100-pF and 1-nF air-dielectric 4TP capacitance standards with known capacitance and loss characteristics over frequency. This paper discusses the significant reductions in measurement uncertainty that were attained through the use of improved calibration standards and measurement method refinements. Details of the uncertainty analysis for a 10-nF capacitor (in the 100-Hz to 10-kHz frequency range) and verification data are presented.
  • Keywords
    calibration; capacitance measurement; ceramic capacitors; comparators (circuits); error analysis; inductance measurement; measurement standards; measurement uncertainty; voltage dividers; LCR meter; calibration standard; capacitance 1 nF; capacitance 10 nF to 100 F; capacitance 100 pF; capacitance scaling system; ceramic-dielectric four-terminal-pair capacitance standards; error analysis; four-terminal-pair capacitors; impedance comparator; impedance meter; inductance-capacitance-resistance meter; measurement uncertainty; single-decade inductive voltage divider; Calibration; Capacitance measurement; Capacitance-voltage characteristics; Capacitors; Error analysis; Frequency measurement; Impedance; Measurement standards; Measurement uncertainty; Voltage; Calibration; capacitance; four-terminal-pair 4TP capacitance; inductance–capacitance–resistance (LCR) meter; inductive voltage dividers (IVDs); uncertainty analysis;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2007.908318
  • Filename
    4389081