Title :
A Method for the Automatic Selection of Test Frequencies in Analog Fault Diagnosis
Author :
Grasso, Francesco ; Luchetta, Antonio ; Manetti, Stefano ; Piccirilli, Maria Cristina
Author_Institution :
Univ. of Florence, Firenze
Abstract :
A new procedure for the selection of test frequencies in the parametric fault diagnosis of analog circuits is presented. It is based on the evaluation of algebraic indices, as the condition number and the norm of the inverse, of a sensitivity matrix of the circuit under test. This matrix is obtained starting from the testability analysis of the circuit. A test index (T.I.) that permits the selection of the set of frequencies that better leads to locating parametric faults in analog circuits is defined. By exploiting symbolic analysis techniques, a program that implements the proposed procedure has been developed. It yields the requested set of frequencies by means of an optimization procedure based on a genetic algorithm that minimizes the T.I. Examples of the application of the proposed procedure are also included.
Keywords :
analogue circuits; circuit analysis computing; circuit testing; fault diagnosis; matrix algebra; algebraic indices; analog circuits; analog fault diagnosis; automatic test frequencies selection; sensitivity matrix; symbolic analysis techniques; test index; testability analysis; Analog circuits; Automatic testing; Circuit faults; Circuit testing; Fault diagnosis; Fault location; Frequency domain analysis; Frequency measurement; Genetic algorithms; Nonlinear equations; Analog circuits; fault diagnosis; fault location; genetic algorithms (GA); symbolic techniques; testability analysis;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2007.907947
