Title :
Linearity and power characteristics of SiGe HBTs at high temperatures for RF applications
Author :
Chen, Kun-Ming ; Peng, An-Sam ; Huang, Guo-Wei ; Chen, Han-Yu ; Huang, Sheng-Yi ; Chang, Chun-Yen ; Tseng, Hua-Chou ; Hsu, Tsun-Lai ; Liang, Victor
Author_Institution :
Nat. Nano Device Labs., Hsinchu, Taiwan
fDate :
7/1/2005 12:00:00 AM
Abstract :
In this paper, the power gain, power-added efficiency (PAE) and linearity of power SiGe heterojunction-bipolar transistors at various temperatures have been presented. The power characteristics were measured using a two-tone load-pull system. For transistors biased with fixed base voltage, the small-signal power gain and PAE of the devices increase with increasing temperature at low base voltages, while they decrease at high base voltages. Besides, the linearity is improved at high temperature for all voltage biases. However, for devices with fixed collector current, the small-signal power gain, PAE, and linearity are nearly unchanged with temperature. The temperature dependence of power and linearity characteristics can be understood by analyzing the cutoff frequency, the collector current, Kirk effect and nonlinearities of transconductance at different temperatures.
Keywords :
Ge-Si alloys; heterojunction bipolar transistors; radiofrequency integrated circuits; semiconductor device testing; Kirk effect; RF application; SiGe; SiGe HBT; collector current; cutoff frequency; heterojunction-bipolar transistor; linearity characteristic; power gain; power-added efficiency; transconductance nonlinearity; two-tone load-pull system; voltage bias; Cutoff frequency; Germanium silicon alloys; Kirk field collapse effect; Linearity; Low voltage; Power measurement; Radio frequency; Silicon germanium; Temperature dependence; Transconductance; Linearity; SiGe HBT; power gain; power-added efficiency; temperature;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2005.850633