• DocumentCode
    988040
  • Title

    Crosstalk reduction in mixed-signal 3-D integrated circuits with interdevice layer ground planes

  • Author

    Kim, Sang Kevin ; Liu, Christianto C. ; Xue, Lei ; Tiwari, Sandip

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
  • Volume
    52
  • Issue
    7
  • fYear
    2005
  • fDate
    7/1/2005 12:00:00 AM
  • Firstpage
    1459
  • Lastpage
    1467
  • Abstract
    We show nearly 8 dB of crosstalk reduction using ground planes between active device layers in three-dimensional (3-D) integrated circuits. Our experimental work utilizes two planes of MOS transistors with tungsten or polysilicon ground planes designed to attenuate crosstalk. Theoretical simulations, using an electromagnetic solver, and the experimental results are consistent with analytical results. The key result verified is that a ground plane, whose footprint shadows the device area, is sufficiently large for effective attenuation. The interdevice layer ground plane provides an effective means to achieve crosstalk reduction in 3-D mixed-signal/RF integration because of simple fabrication and high coupling isolation.
  • Keywords
    MOSFET; circuit simulation; crosstalk; integrated circuit noise; isolation technology; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; silicon; tungsten; MOS transistor; crosstalk reduction; electromagnetic solver; interdevice layer ground plane; mixed-signal 3-D integrated circuit; polysilicon ground plane; tungsten ground plane; Analytical models; Attenuation; Circuit simulation; Crosstalk; Electromagnetic analysis; Fabrication; MOSFETs; Radio frequency; Three-dimensional integrated circuits; Tungsten; 3-D integration; Coupling; crosstalk; ground plane; isolation technology; mixed-signal circuits; radio frequency (RF) isolation; system-on-chip (SoC) integration; three-dimensional (3-D) ICs;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2005.850641
  • Filename
    1459105