DocumentCode :
988040
Title :
Crosstalk reduction in mixed-signal 3-D integrated circuits with interdevice layer ground planes
Author :
Kim, Sang Kevin ; Liu, Christianto C. ; Xue, Lei ; Tiwari, Sandip
Author_Institution :
Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
Volume :
52
Issue :
7
fYear :
2005
fDate :
7/1/2005 12:00:00 AM
Firstpage :
1459
Lastpage :
1467
Abstract :
We show nearly 8 dB of crosstalk reduction using ground planes between active device layers in three-dimensional (3-D) integrated circuits. Our experimental work utilizes two planes of MOS transistors with tungsten or polysilicon ground planes designed to attenuate crosstalk. Theoretical simulations, using an electromagnetic solver, and the experimental results are consistent with analytical results. The key result verified is that a ground plane, whose footprint shadows the device area, is sufficiently large for effective attenuation. The interdevice layer ground plane provides an effective means to achieve crosstalk reduction in 3-D mixed-signal/RF integration because of simple fabrication and high coupling isolation.
Keywords :
MOSFET; circuit simulation; crosstalk; integrated circuit noise; isolation technology; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; silicon; tungsten; MOS transistor; crosstalk reduction; electromagnetic solver; interdevice layer ground plane; mixed-signal 3-D integrated circuit; polysilicon ground plane; tungsten ground plane; Analytical models; Attenuation; Circuit simulation; Crosstalk; Electromagnetic analysis; Fabrication; MOSFETs; Radio frequency; Three-dimensional integrated circuits; Tungsten; 3-D integration; Coupling; crosstalk; ground plane; isolation technology; mixed-signal circuits; radio frequency (RF) isolation; system-on-chip (SoC) integration; three-dimensional (3-D) ICs;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2005.850641
Filename :
1459105
Link To Document :
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