DocumentCode :
988083
Title :
Large capacity ion-implanted bubble devices
Author :
Bonyhard, Peter I. ; Hagedorn, F.B. ; Ekholm, D.T. ; Muehlner, D.J. ; Nelson, T.J. ; Roman, B.J.
Author_Institution :
Bell Laboratories, Murray Hill, NJ
Volume :
18
Issue :
2
fYear :
1982
fDate :
3/1/1982 12:00:00 AM
Firstpage :
737
Lastpage :
740
Abstract :
Half-megabit bubble memory chips, with patterned ion implants used to propagate bubbles, have been designed and characterized. Bubbles with 1.7-μm diameter were used on a 6-μm to 8-μm circuit period and were propagated by rotating fields of 40 Oe at 50 kHz. The chips had 284 2051-bit storage loops, of which 258 were required to operate. Overall bias field margin ranges of 16 Oe to 19 Oe have been demonstrated on functionally complete, nonvolatile chips with nondestructive readout. Most functional parameters have wide margin ranges, but further design improvements are necessary to widen the margin ranges of the drive field and the transfer-out trailing edge phase.
Keywords :
Magnetic bubble device fabrication; Magnetic bubble memories; Artificial intelligence; Circuits; Electron devices; Ice; Implants; Independent component analysis; Josephson junctions; Logic devices; Logic gates; SQUID magnetometers;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1982.1061816
Filename :
1061816
Link To Document :
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