Title :
Why are nonlinear microwave systems measurements so involved?
Author :
Rolain, Yves ; Van Moer, Wendy ; Vandersteen, Gerd ; Schoukens, Johan
Author_Institution :
Electr. Meas. Dept., Vrije Univ. Brussel, Belgium
fDate :
6/1/2004 12:00:00 AM
Abstract :
Performing nonlinear measurements on microwave devices is a complex task. This paper introduces, step by step, the key concepts that make the difference between linear S-parameter measurements and nonlinear measurements. The main goal here is to make nonlinear measurements more accessible to the practicing microwave engineer.
Keywords :
S-parameters; calibration; microwave devices; microwave measurement; nonlinear systems; linear 5-parameter measurements; microwave measurements; nonlinear calibration; nonlinear measurements; nonlinear microwave systems; nonlinear systems; scattering parameters; Calibration; Frequency; Government; Instruments; Linear systems; Microwave devices; Microwave measurements; Nonlinear systems; Power system modeling; Scattering parameters; Microwave measurements; nonlinear calibration; nonlinear measurement; nonlinear systems; scattering parameters;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2004.827297
