• DocumentCode
    988122
  • Title

    High-Frequency-Measurement-Based Circuit Modeling and Power/Ground Integrity Evaluation of Integrated Circuit Packages

  • Author

    Kim, Heungkyu ; Eo, Yungseon

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Hanyang Univ., Ansan
  • Volume
    31
  • Issue
    4
  • fYear
    2008
  • Firstpage
    910
  • Lastpage
    918
  • Abstract
    The frequency-variant characteristics of a pair of package power and ground net are experimentally investigated and modeled by using frequency-variant grid-type equivalent circuits, where each cell of the grid is modeled with vertically stacked RLC-ladder circuits. Various test patterns are designed and fabricated by employing a ball grid array (BGA) package process. Then the test patterns are characterized by using impedance analyzer, time domain reflectometry and time domain transmission (TDR/TDT), and vector network analyzer (VNA). Based on the experimental characterizations, not only are material constants and circuit model parameters determined, but also the conductor roughness and other frequency-variant effects are modeled. It is shown that the SPICE-based circuit simulation using the proposed circuit model has an excellent agreement with the measurement data in the range of 100 MHz - 15 GHz. Then, it is also shown that the various types of package performance evaluations can be very efficiently as well as accurately achieved with the proposed technique.
  • Keywords
    ball grid arrays; equivalent circuits; integrated circuit packaging; time-domain reflectometry; SPICE-based circuit simulation; ball grid array package process; frequency 100 MHz to 15 GHz; frequency-variant grid-type equivalent circuits; high-frequency-measurement-based circuit modeling; integrated circuit packages; power-ground integrity evaluation; time domain reflectometry; time domain transmission; vector network analyzer; vertically stacked RLC-ladder circuits; Circuit testing; Conducting materials; Electronics packaging; Equivalent circuits; Frequency; Impedance; Integrated circuit modeling; Integrated circuit packaging; Pattern analysis; Time domain analysis; S-parameters; Ball grid array (BGA) package; frequency variant circuit model; power distribution net; skin effect; transmission line;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2008.2005472
  • Filename
    4674542