A 3-TFT current-programmed pixel circuit for AMOLEDs

Author

Ashtiani, Shahin J. ; Servati, Peyman ; Striakhilev, Denis ; Nathan, Arokia

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Ont., Canada

Volume

52

Issue

7

fYear

2005

fDate

7/1/2005 12:00:00 AM

Firstpage

1514

Lastpage

1518

Abstract

Current programmed circuits have demonstrated threshold voltage V_TH shift compensation to provide a stable drive current to the organic light-emitting diode (OLED). However, the degree of stability of drive current depends critically on the dynamic behavior of the circuit. This paper examines the dynamic behavior of a 3-TFT current programmed pixel and analyzes the impact of V_TH shift on the OLED drive current. The pixel circuit was implemented in amorphous silicon technology and lifetime tests show a 11% current degradation at 700 h.

Keywords

LED displays; amorphous semiconductors; driver circuits; organic light emitting diodes; semiconductor device testing; silicon; thin film transistors; 3-TFT current-programmed pixel circuit; AMOLEDs; OLED drive current; Si; active-matrix organic light-emitting diode; amorphous silicon technology; current degradation; current programmed circuits; lifetime tests; thin-film transistor; threshold voltage shift compensation; Active matrix organic light emitting diodes; Active matrix technology; Amorphous silicon; Capacitors; Circuits; Organic light emitting diodes; Technological innovation; Thermal degradation; Thin film transistors; Threshold voltage; Active-matrix organic light-emitting diode (AMOLED); amorphous silicon (a-Si); pixel circuit; thin-film transistor (TFT);

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/TED.2005.850615

Filename

1459113