DocumentCode :
988192
Title :
Substrate voltage and accumulation-mode MOS varactor capacitance
Author :
Wartenberg, Scott A. ; Hauser, John R.
Author_Institution :
Booz Allen Hamilton, Arlington, VA, USA
Volume :
52
Issue :
7
fYear :
2005
fDate :
7/1/2005 12:00:00 AM
Firstpage :
1563
Lastpage :
1567
Abstract :
To adjust the capacitance of an accumulation-mode MOS varactor, a voltage is applied to the drain/source with the gate grounded. In this novel arrangement, a voltage is applied to the gate Vgate and another to the substrate Vsub with the drain/source grounded. Applying Vsub between the p+-type substrate and the varactor´s n-well adjusts the minimum capacitance Cmin and flattens the overall capacitance-voltage (C-V) curve over a wide range of negative Vgate. Measurements show the tuning range using Vsub to be as wide as that using Vgate. By tuning with Vsub, the capacitance Cmin is constant over a range of negative Vgate. In this region, it may be possible to apply a large ac signal on Vgate without modulating the capacitance. To illustrate this technique, C-V measurements of a MOS varactor are simulated in a differential LC-tank VCO circuit. Simulations show how adjusting both Vgate and Vsub alters the oscillation frequency.
Keywords :
MIS devices; MOS capacitors; capacitance; capacitance measurement; circuit simulation; varactors; voltage measurement; voltage-controlled oscillators; C-V measurements; LC-tank VCO circuit; MOS varactor capacitance; accumulation-mode; capacitance-voltage curve; metal-oxide-semiconductor; minimum capacitance; oscillation frequency; phase noise; substrate voltage; tuning range; voltage-controlled oscillator; Capacitance measurement; Circuit simulation; Electrical resistance measurement; Frequency; Phase noise; Substrates; Tuning; Varactors; Voltage; Voltage-controlled oscillators; Accumulation mode; capacitance; metal–oxide–semiconductor (MOS); phase noise; varactor; voltage-controlled oscillator (VCO);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2005.850953
Filename :
1459120
Link To Document :
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