Measuring the sensitivity of microwave components to bias variations

This paper presents a method to measure the sensitivity of microwave components to memory effects caused by the dc biasing circuit. This allows us to determine the required (impedance) properties of the dc biasing circuit to reduce slow dynamics under a certain level. The proposed measurement technique is based on the nonlinear vectorial network analyzer, which allows us to measure not only the absolute magnitude but also the absolute phase relations between the waves. Superimposing a multisine excitation signal on the dc bias allows us to measure the slow dynamics caused by the dc biasing circuit as a function of frequency and input power. Furthermore, it is verified whether or not the measured phenomena depend on the type of excitation signal.