• DocumentCode
    988226
  • Title

    Image reconstruction from the Compton scattering of X-ray fan beams in thick/dense objects

  • Author

    Arsenault, Paul J. ; Hussein, Esam M A

  • Author_Institution
    Dept. of Mech. Eng., Lab. for Threat Material Detection, Fredericton, NB, Canada
  • Volume
    53
  • Issue
    3
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    1622
  • Lastpage
    1633
  • Abstract
    Image reconstruction from Compton scattering measurements results in a nonlinear inverse problem that can produce multiple solutions, particularly in deep/dense objects. In this work, the nonlinearity of the problem is mitigated by a transformation which minimizes the difference of the ratios of measurements with overlapping fields of view. Overlapping eliminates one of the competing factors in the nonlinear problem, and allows solving the inverse problem of image reconstruction beyond the one-mean-free path equivalent depth previously needed to reach a solution in scatter-only imaging. The method also enables the use of wide X-ray fan beam sources, and is numerically applied to exploit the ability of scatter imaging to acquire single-side two-dimensional (2-D) and three-dimensional (3-D) images of relatively dense objects. Examples are presented to demonstrate the method´s ability to deal with noisy measurements, at various degrees of overdetermination.
  • Keywords
    Compton effect; X-ray detection; X-ray imaging; image reconstruction; inverse problems; 2D images; 3D images; Compton scattering; X-ray fan beam sources; image reconstruction; noisy measurements; nonlinear inverse problem; one-mean-free path; scatter imaging; thick-dense objects; Attenuation; Detectors; Electromagnetic scattering; Image reconstruction; Light scattering; Optical imaging; Optical scattering; Particle scattering; X-ray imaging; X-ray scattering; Compton scatter imaging; X-ray applications; image reconstruction;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2006.874074
  • Filename
    1645079