• DocumentCode
    988227
  • Title

    CMOS Avalanche Photodiode Embedded in a Phase-Shift Laser Rangefinder

  • Author

    Moutaye, Emmanuel R. ; Tap-Béteille, Hélène

  • Author_Institution
    Electron. Lab. of INPT-ENSEEIHT, Toulouse
  • Volume
    55
  • Issue
    12
  • fYear
    2008
  • Firstpage
    3396
  • Lastpage
    3401
  • Abstract
    This paper presents the design and the characterization of a CMOS avalanche photodiode (APD) working as an optoelectronic mixer. The P+N photodiode has been implemented in a commercial 0.35-mum CMOS technology after optimization with SILVACO. The surface of the active region is 3.78 middot10-3 cm2. An efficient guard-ring structure has been created using the lateral diffusion of two n-well regions separated by a gap of 1.2 mum. When biased at -2 V, the best responsitivity Slambda APD = 0.11 A/W is obtained at lambda = 500 nm. This value can easily be improved by using an antireflection coating. At lambda = 472 nm, the internal gain is about 75 at -6 V and 157 at -7 V. When biased at -6 V, the APD achieves a dark current of 128 muA middotmm-2 and an excess noise factor F = 20. Then, the APD is successfully used as an optoelectronic mixer to improve the signal-to-noise ratio of a low-voltage embedded phase-shift laser rangefinder.
  • Keywords
    CMOS integrated circuits; antireflection coatings; avalanche photodiodes; integrated optoelectronics; phase shifters; CMOS avalanche photodiode; P+N photodiode; SILVACO; antireflection coating; low-voltage embedded phase-shift laser rangefinder; optoelectronic mixer; size 0.35 mum; size 1.2 mum; voltage -2 V; voltage -6 V; voltage -7 V; wavelength 472 nm; wavelength 500 nm; Avalanche photodiodes; CMOS process; CMOS technology; Coatings; Dark current; Distance measurement; Optical design; Pulse measurements; Surface emitting lasers; Time measurement; Avalanche photodiodes (APDs); CMOS integrated circuits; distance measurement; integrated optoelectronics;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2008.2006778
  • Filename
    4674555