DocumentCode :
988243
Title :
A Low-Cost Fault-Tolerant Real, Reactive, and Apparent Power Measurement Technique Using Microprocessor
Author :
Sarkar, Arghya ; Sengupta, Samarjit
Volume :
56
Issue :
6
fYear :
2007
Firstpage :
2672
Lastpage :
2680
Abstract :
Errors may creep in when measuring power by conventional methods due to the inductance and capacitance of the coils and the induced eddy current in the metal parts of the instruments through the alternating magnetic field of the current coil. Apart from these, if a fault occurs in any of the potential transformer secondary circuits or the potential coil of the measuring equipment, a conventional meter cannot detect it, which results in underregistration. In this paper, a microprocessor-based threephase real, reactive, and apparent power measurement system is developed, which displays the power being fed to a load under both normal and faulty conditions. The microprocessor provides a simple, accurate, reliable, and economical solution to these problems. A framework of the hardware circuitry and the assembly language program for the evaluation of power values is given, and the problems to which attention should be paid to execute the proposed algorithm using the microprocessor are discussed. Illustrative laboratory test results confirm the validity and accurate performance of the proposed method in real-time.
Keywords :
assembly language; fault tolerance; microprocessor chips; potential transformers; power measurement; reactive power; assembly language program; fault-tolerant reactive power; hardware circuitry; microprocessor; potential coil; potential transformer secondary circuit; power measurement technique; Capacitance measurement; Circuit faults; Coils; Creep; Current measurement; Fault tolerance; Inductance measurement; Magnetic field measurement; Microprocessors; Power measurement; Active power; apparent power; fault tolerant; measurement; microprocessor; reactive power;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2007.907946
Filename :
4389141
Link To Document :
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