DocumentCode :
988322
Title :
Experimental characterization of operational amplifiers: a system identification Approach-part I: theory and Simulations
Author :
Pintelon, Rik ; Vandersteen, Gerd ; De Locht, Ludwig ; Rolain, Yves ; Schoukens, Johan
Author_Institution :
Electr. Meas. Dept., Vrije Univ. Brussel, Brussels, Belgium
Volume :
53
Issue :
3
fYear :
2004
fDate :
6/1/2004 12:00:00 AM
Firstpage :
854
Lastpage :
862
Abstract :
Using specially designed broadband periodic random excitation signals, the open loop, the common mode, and the power supply gains of operational amplifiers are measured and modeled. The proposed modeling technique: 1) takes into account the measurement uncertainty and the nonlinear distortions, 2) gives information about possible unmodeled dynamics, 3) detects, quantifies, and classifies the nonlinear distortions, and 4) provides opamp parameters (time constants, gain-bandwidth product, etc.) with confidence bounds. The approach is suitable for the experimental characterization of operational amplifiers (see [23]) as well as the fast evaluation of new operational amplifiers designs using network simulators (see Part I). Part I describes the modeling approach and illustrates the theory on simulations.
Keywords :
circuit simulation; nonlinear distortion; operational amplifiers; broadband signals; common mode gain; common mode rejection; linear characteristics; measurement uncertainty; nonlinear distortions; opamp parameters; open loop gain; operational amplifiers; periodic signals; power supply gain; power supply rejection; random excitation signals; system identification; unmodeled dynamics; Broadband amplifiers; Distortion measurement; Nonlinear distortion; Operational amplifiers; Power amplifiers; Power measurement; Power supplies; Power system modeling; Signal design; System identification; Common mode rejection; linear characteristics; nonlinear distortions; open loop gain; operational amplifier; power supply rejection; system identification;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2004.827094
Filename :
1299152
Link To Document :
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