• DocumentCode
    988369
  • Title

    High-resolution alpha-particle spectrometry using 4H silicon carbide semiconductor detectors

  • Author

    Ruddy, Frank H. ; Seidel, John G. ; Chen, Haoqian ; Dulloo, Abdul R ; Ryu, Sei-Hyung

  • Author_Institution
    Sci. & Technol. Center, Westinghouse Electr. Corp., Pittsburgh, PA, USA
  • Volume
    53
  • Issue
    3
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    1713
  • Lastpage
    1718
  • Abstract
    SiC detectors with active volume dimensions sufficient to stop alpha particles have been manufactured and tested. A linear energy response and excellent energy resolution have been obtained for various alpha emitters in the 3.18-MeV to 8.38-MeV energy range. Evaluation of the contributing factors to the SiC detector energy resolution indicates that the measured values for the full width at half maximum (FWHM) are limited by energy straggling of the alpha particles as they pass through the metallic contact layers that comprise the entrance window to the detector. Even with this component included in the measured FWHM, the measured values are comparable to those achievable with silicon alpha spectrometers. The possibility that the energy resolution that can be achieved with SiC may surpass that of silicon can not be excluded. SiC alpha spectrometers are expected to be useful in many nuclear applications where the ability to operate in high-temperature and high-radiation environments is required. Such applications include monitoring of alpha particles, neutrons, and low-energy gamma rays and X-rays in actinide waste-tank environments as well as neutron and gamma-ray monitoring of spent nuclear fuel assemblies.
  • Keywords
    alpha-particle detection; alpha-particle spectrometers; silicon radiation detectors; 4H silicon carbide semiconductor detectors; FWHM; SiC detector energy resolution; X-rays; actinide waste-tank environments; active volume dimensions; energy straggling; entrance window; gamma-ray monitoring; high-radiation environments; high-resolution alpha-particle spectrometry; high-temperature environments; linear energy response; low-energy gamma rays; metallic contact layers; neutron monitoring; neutrons; radiation detectors; silicon alpha spectrometers; spent nuclear fuel assemblies; Alpha particles; Detectors; Energy measurement; Energy resolution; Monitoring; Neutrons; Semiconductor device manufacture; Silicon carbide; Spectroscopy; Testing; Radiation detectors; resolution; silicon carbide; spectroscopy;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2006.875155
  • Filename
    1645091