• DocumentCode
    988435
  • Title

    Erratum: Thermally accelerated degradation of 1.3 ¿m BH lasers

  • Author

    Nakano, Yoshiaki ; Fukuda, Motohisa ; Sudo, H. ; Fujita, O. ; Iwane, G.

  • Volume
    19
  • Issue
    19
  • fYear
    1983
  • Firstpage
    803
  • Keywords
    III-V semiconductors; ageing; gallium arsenide; indium compounds; life testing; 1.3 microns; ACC lifetests; CW threshold current; III-V semiconductors; InGaAsP lasers; buried heterostructure; high-stress aging; thermally accelerated degradation;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19830547
  • Filename
    4248063