Title :
Nonlinearity estimation and compensation of PWM VSI for PMSM under resistance and flux linkage uncertainty
Author :
Kim, Hag-Wone ; Youn, Myung-Joong ; Cho, Kwan-Yuhl ; Kim, Hyun-Soo
Author_Institution :
Digital Appliance Lab., LG Electron. Co. Ltd., Seoul, South Korea
fDate :
7/1/2006 12:00:00 AM
Abstract :
Generally, there exists a voltage distortion or nonlinear voltage gain between the reference and output voltages in a pulsewidth-modulation (PWM) voltage source inverter (VSI). Nonlinearity varies with operating conditions, such as the temperature, direct current (dc) bus voltage, and phase current level. Also, the nonlinearity affects the machine current distortion, torque pulsations, and degradation of control performance. In this paper, the nonlinearity in a PWM VSI is analyzed and a new online estimation method based on the model reference adaptive system is proposed to compensate the time varying voltage distortion, considering the parameter uncertainty caused by the temperature variation for a permanent magnet synchronous motor. The simulation and experimental results show the effectiveness of the proposed voltage difference estimator.
Keywords :
PWM invertors; control nonlinearities; machine control; model reference adaptive control systems; nonlinear estimation; permanent magnet motors; synchronous motors; time-varying systems; uncertain systems; voltage control; PMSM; PWM VSI; flux linkage uncertainty; model reference adaptive system; nonlinearity compensation; nonlinearity estimation; parameter uncertainty; permanent magnet synchronous motor; pulsewidth-modulation; time varying voltage distortion; voltage source inverter; Couplings; Degradation; Nonlinear distortion; Pulse inverters; Pulse width modulation; Pulse width modulation inverters; Temperature; Torque control; Uncertainty; Voltage; Dead time compensation; MRAS (model reference adaptive system); nonlinearity estimation; voltage distortion of pulsewidth-modulation (PWM) voltage source inverter (VSI);
Journal_Title :
Control Systems Technology, IEEE Transactions on
DOI :
10.1109/TCST.2006.876622