Title :
Normalisation of Fourier descriptors of planar shapes
Author :
Prakash, Sachin ; Heyden, F.V.D.
Author_Institution :
Twente University of Technology, Measuring Techniques & Instrumentation Laboratory, Department of Electrical Engineering, Enschede, Netherlands
Abstract :
Fourier descriptors (FDs) are one of the efficient tools for discrimination of planar shapes. The problem of achieving a unique normalisation of the given set of FDs has not been solved satisfactorily. An improved method for normalisation which has applicability over a wider range of shapes is suggested in the letter. A sufficient condition for the axial symmetry of a contour is also given.
Keywords :
Fourier analysis; information theory; pattern recognition; Fourier descriptors; contour axial symmetry; information theory; normalisation; planar shape discrimination;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19830564
