DocumentCode
988867
Title
Reply: Analysis of radiative and nonradiative recombination law in lightly doped InGaAsP lasers
Author
Thompson, G.H.B.
Author_Institution
STL Ltd, Harlow, UK
Volume
19
Issue
21
fYear
1983
Firstpage
868
Keywords
integrated circuit testing; masks; monolithic integrated circuits; CAD system; MOS technology; high resolution aligners; mask levels; mask misalignment; mask resolution; semiconductor IC testing; test structure; vernier;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19830590
Filename
4248118
Link To Document