DocumentCode
989030
Title
Multithresholding for arithmetic logic pattern matching
Author
Lee, Chi Kwan ; Li, K.C.
Volume
29
Issue
5
fYear
1993
fDate
3/4/1993 12:00:00 AM
Firstpage
481
Lastpage
483
Abstract
A new multithresholding scheme is presented to improve the peak score in a noisy environment for a 2D pattern searching system with multibit EXNOR proximity measure. This scheme combines the interclass thresholds and minimum noise error thresholds for robust recognition process.
Keywords
automatic optical inspection; pattern recognition; 2D pattern searching system; AOI; arithmetic logic; industrial inspection; interclass thresholds; minimum noise error thresholds; multibit EXNOR proximity measure; multithresholding scheme; noisy environment; pattern matching; robust recognition process;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19930322
Filename
250282
Link To Document