• DocumentCode
    989199
  • Title

    Simulation Analysis of Higher Order Laterally-Coupled Distributed Feedback Lasers

  • Author

    Millett, Ronald R. ; Hinzer, Karin ; Hall, Trevor J. ; Schriemer, Henry

  • Author_Institution
    Centre for Res. in Photonics, Ottawa Univ., Ottawa, ON
  • Volume
    44
  • Issue
    12
  • fYear
    2008
  • Firstpage
    1145
  • Lastpage
    1151
  • Abstract
    Laterally-coupled distributed feedback (LC-DFB) lasers use a lithographic fabrication step to define the distributed feedback grating, avoiding subsequent regrowth. Using higher order gratings can enhance the lithographic tolerance for lower resolution patterning, yielding lasers more amenable to fabrication. We show that LC-DFB lasers with higher order gratings, although requiring a higher threshold gain than those of first-order, provide a degree of longitudinal mode discrimination. Incorporating radiating partial waves, we have calculated modified coupled-mode coefficients for various duty cycles, grating orders, and grating geometries using a two-dimensional finite-element method. The modified coupled-mode equations were solved with and without a lambda/4 phase shift. The phase shift, while beneficial for first-order gratings, was found to generally diminish laser performance for lasers with higher order gratings.
  • Keywords
    coupled mode analysis; diffraction gratings; distributed feedback lasers; finite element analysis; laser modes; semiconductor lasers; coupled-mode coefficients; grating geometries; higher order gratings; laterally-coupled distributed feedback lasers; phase shift; semiconductor lasers; two-dimensional finite-element method; Analytical models; Distributed feedback devices; Gratings; Laser feedback; Laser modes; Laser theory; Optical coupling; Semiconductor lasers; Surface emitting lasers; Waveguide lasers; Distributed feedback lasers; coupled-mode theory; semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2008.2002089
  • Filename
    4674653