DocumentCode :
989230
Title :
A new refractory self-aligned gate technology for GaAs microwave power FETs and MMICs
Author :
Geissberger, Arthur E. ; Bahl, Inder J. ; Griffin, Edward L. ; Sadler, Robert A.
Author_Institution :
ITT Gallium Arsenide Technol. Center, Roanoke, VA, USA
Volume :
35
Issue :
5
fYear :
1988
fDate :
5/1/1988 12:00:00 AM
Firstpage :
615
Lastpage :
622
Abstract :
The authors fabricated GaAs power FETs and microwave ICs using a novel fully planar, refractory self-aligned gate process. This process uses methods to reduce the gate resistance and output conductance without sacrificing simplicity. Because it is compatible with the use of an optical stepper, the process is suitable for manufacturing use. The C-band RF performance is excellent; the very uniform and reproducible device parameters resulted in a first-iteration 2.5-W C -band power amplifier that met design specifications on the first lot of wafers processed
Keywords :
III-V semiconductors; Schottky gate field effect transistors; field effect integrated circuits; gallium arsenide; integrated circuit technology; microwave amplifiers; microwave integrated circuits; power amplifiers; power transistors; solid-state microwave devices; 1.9 W; 2.5 W; 38 percent; 5.5 GHz; 8 dB; C-band RF performance; C-band power amplifier; GaAs; MMICs; gate resistance; microwave ICs; microwave power FETs; optical stepper; output conductance; power added efficiency; refractory self-aligned gate technology; FETs; Gallium arsenide; Manufacturing processes; Microwave technology; Optical amplifiers; Optical refraction; Power amplifiers; Radio frequency; Radiofrequency amplifiers; Stimulated emission;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.2503
Filename :
2503
Link To Document :
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