• DocumentCode
    989305
  • Title

    Measurements of the semiconductor laser linewidth broadening factor

  • Author

    Henning, I.D. ; Collins, J.V.

  • Author_Institution
    British Telecom Research Laboratories, Ipswich, UK
  • Volume
    19
  • Issue
    22
  • fYear
    1983
  • Firstpage
    927
  • Lastpage
    929
  • Abstract
    A new method is presented for determining the semiconductor-laser linewidth-broadening factor ¿. Measurements on 1.5 ¿m devices suggest that ¿ decreases with decreasing laser length. 300 ¿m-long devices emitting at 1.3 and 1.5 ¿m were found to have similar values of ¿ (6.6 cf. 6 4), but at 0.85 ¿m significantly lower results were measured (2.8)
  • Keywords
    optical variables measurement; semiconductor junction lasers; spectral line breadth; 1.3 micron devices; 1.5 micron devices; semiconductor laser linewidth broadening factor; spectral linewidth;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19830633
  • Filename
    4248168
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=989305