DocumentCode :
989612
Title :
Effect of auger recombination on the threshold characteristics of gain-guided InGaAsP lasers
Author :
Agrawal, Govind P. ; Dutta, N.K.
Author_Institution :
Bell Laboratories, Murray Hill, USA
Volume :
19
Issue :
23
fYear :
1983
Firstpage :
974
Lastpage :
976
Abstract :
Experimental and theoretical results are presented to study the effect of Auger recombination on the threshold current of gain-guided InGaAsP lasers. A comparison of theory and experiment suggests that Auger recombination should be included for a reasonable agreement between them. It is shown that a rapid increase of the threshold current for narrow stripes is due to the combined effect of index anti-guiding and Auger recombination. Our deduced values of the Auger coefficient at 1.3 and 1.55 ¿m indicate that it increases rapidly with decreasing bandgap.
Keywords :
Auger effect; III-V semiconductors; gallium arsenide; indium compounds; semiconductor junction lasers; Auger coefficient; Auger recombination; III-V semiconductors; bandgap; gain-guided InGaAsP lasers; index antiguiding; narrow stripes; semiconductor junction lasers; threshold current;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19830662
Filename :
4248203
Link To Document :
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