Title :
Functional testing for cellular neural networks
Author :
Willis, J. ; Pineda de Gyvez, J.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
A novel approach to test the functional behaviour of cellular neural networks (CNNs) is proposed. The method attains 100% stuck-at fault coverage regardless of the array size without any extra hardware for its implementation. The Letter discusses the new fault model, presents the algorithmic procedures and shows simulated testing results.
Keywords :
cellular arrays; logic testing; neural nets; CNNs; algorithmic procedures; analogue cellular nonlinear dynamic processor array; cellular neural networks; functional testing; simulated testing results; stuck-at fault coverage;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19931482
