Title :
Wide-span optical frequency comb generator for accurate optical frequency difference measurement
Author :
Kourogi, Motonobu ; Nakagawa, Ken Ichi ; Ohtsu, Motoichi
Author_Institution :
Grad. Sch. of Sci. & Eng., Tokyo Inst. of Technol., Yokohama, Japan
fDate :
10/1/1993 12:00:00 AM
Abstract :
An optical frequency comb (OFC) generator was realized for accurate optical frequency difference measurement of 1.5 μm wavelength semiconductor lasers by using a high frequency LiNbO3 electrooptic phase modulator which was installed in a Fabry-Perot cavity. It was confirmed that the span of the OFC was wider than 4 THz. By using semiconductor lasers whose spectrum linewidths were narrowed to 1 kHz and a sensitive optical balanced-mixer-receiver for measuring beat signal between the sideband of the comb and the laser, we demonstrated a frequency difference measurement up to 0.5 THz with a signal-to-noise ratio higher than 61 dB, and a heterodyne optical phase locking with a heterodyne frequency of 0.5 THz in which the residual phase error variance was less than 0.01 rad2. The maximum measurable frequency difference, which was defined as the sideband frequency with the signal-to-noise ratio of 0 dB, was estimated to be 4 THz
Keywords :
electro-optical devices; laser variables measurement; lithium compounds; optical modulation; phase modulation; semiconductor lasers; spectral line breadth; 0.5 THz; 1.5 mum; 4 THz; Fabry-Perot cavity; LiNbO3; LiNbO3 electrooptic phase modulator; accurate optical frequency difference measurement; beat signal; heterodyne optical phase locking; high frequency; optical frequency difference measurement; residual phase error variance; semiconductor lasers; sensitive optical balanced-mixer-receiver; sideband frequency; signal-to-noise ratio; spectrum linewidths; wide-span optical frequency comb generator; Frequency estimation; Frequency measurement; Lasers and electrooptics; Optical mixing; Optical modulation; Optical sensors; Phase measurement; Semiconductor lasers; Signal to noise ratio; Wavelength measurement;
Journal_Title :
Quantum Electronics, IEEE Journal of