DocumentCode
990303
Title
High-power aging test on 1.3 μm DC-PBH lasers with reflective coated mirror
Author
Murata, Shotaro ; Kitamura, Masayuki ; Yamaguchi, Masaki ; Mito, I. ; Kobayashi, Kaoru
Author_Institution
NEC Corporation, Opto-Electronics Research Laboratories, Kawasaki, Japan
Volume
19
Issue
25
fYear
1983
Firstpage
1084
Lastpage
1085
Abstract
High-power aging tests on 1.3 μm double-channel planar buried-heterostructure (DC-PBH) lasers with a reflective coated mirror have been performed. Stable operation for over 6000 h has been demonstrated under constant power conditions of 20 and 30 mW from the front facet at 50°C.
Keywords
III-V semiconductors; ageing; gallium arsenide; indium compounds; life testing; semiconductor device testing; semiconductor junction lasers; 1.3 micron laser; DC-PBH lasers; InGaAsP/InP semiconductor laser; double-channel planar buried-heterostructure; high power ageing test; reflective coated mirror; stable generation;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19830735
Filename
4248297
Link To Document