• DocumentCode
    990303
  • Title

    High-power aging test on 1.3 μm DC-PBH lasers with reflective coated mirror

  • Author

    Murata, Shotaro ; Kitamura, Masayuki ; Yamaguchi, Masaki ; Mito, I. ; Kobayashi, Kaoru

  • Author_Institution
    NEC Corporation, Opto-Electronics Research Laboratories, Kawasaki, Japan
  • Volume
    19
  • Issue
    25
  • fYear
    1983
  • Firstpage
    1084
  • Lastpage
    1085
  • Abstract
    High-power aging tests on 1.3 μm double-channel planar buried-heterostructure (DC-PBH) lasers with a reflective coated mirror have been performed. Stable operation for over 6000 h has been demonstrated under constant power conditions of 20 and 30 mW from the front facet at 50°C.
  • Keywords
    III-V semiconductors; ageing; gallium arsenide; indium compounds; life testing; semiconductor device testing; semiconductor junction lasers; 1.3 micron laser; DC-PBH lasers; InGaAsP/InP semiconductor laser; double-channel planar buried-heterostructure; high power ageing test; reflective coated mirror; stable generation;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19830735
  • Filename
    4248297