Title :
High-power aging test on 1.3 μm DC-PBH lasers with reflective coated mirror
Author :
Murata, Shotaro ; Kitamura, Masayuki ; Yamaguchi, Masaki ; Mito, I. ; Kobayashi, Kaoru
Author_Institution :
NEC Corporation, Opto-Electronics Research Laboratories, Kawasaki, Japan
Abstract :
High-power aging tests on 1.3 μm double-channel planar buried-heterostructure (DC-PBH) lasers with a reflective coated mirror have been performed. Stable operation for over 6000 h has been demonstrated under constant power conditions of 20 and 30 mW from the front facet at 50°C.
Keywords :
III-V semiconductors; ageing; gallium arsenide; indium compounds; life testing; semiconductor device testing; semiconductor junction lasers; 1.3 micron laser; DC-PBH lasers; InGaAsP/InP semiconductor laser; double-channel planar buried-heterostructure; high power ageing test; reflective coated mirror; stable generation;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19830735
