• DocumentCode
    990345
  • Title

    On the generation of area-time optimal testable adders

  • Author

    Becker, Bernd ; Drechsler, Rolf ; Molitor, Paul

  • Author_Institution
    Dept. of Comput. Sci., Freiburg Univ., Germany
  • Volume
    14
  • Issue
    9
  • fYear
    1995
  • fDate
    9/1/1995 12:00:00 AM
  • Firstpage
    1049
  • Lastpage
    1066
  • Abstract
    We present a performance driven generator for integer adders which has the following interesting feature: The generator is parametrized in the operands´ bitlength n, the delay of the addition tn, and the fault model FM. FM may in particular be chosen as the classical stuck-at fault model, the cellular fault model or the robust path delay fault model. The output of the generator is a performance oriented conditional sum type adder, i.e., an area-minimal n-bit adder of the “conditional sum type” with delay ⩽tn (if it exists) together with a small complete test set with respect to the chosen fault model FM
  • Keywords
    adders; circuit layout CAD; circuit optimisation; computational complexity; design for testability; dynamic programming; fault diagnosis; integrated circuit layout; logic CAD; logic testing; area-time optimal adder generation; cellular fault model; conditional sum type adder; fault model; integer adders; performance driven generator; performance oriented adder; robust path delay fault model; stuck-at fault model; testable adders; Added delay; Adders; Circuit faults; Circuit testing; Computer science; Fault detection; Integrated circuit modeling; Integrated circuit testing; Logic; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.406707
  • Filename
    406707