DocumentCode :
990752
Title :
Low resistance and reflective Mg-doped indium oxide-Ag ohmic contacts for flip-chip light-emitting diodes
Author :
Song, June O. ; Leem, Dong-Seok ; Kwak, J.S. ; Nam, O.H. ; Park, Y. ; Seong, Tae-Yeon
Author_Institution :
Dept. of Mater. Sci. & Eng., Gwangju Inst. of Sci. & Technol., South Korea
Volume :
16
Issue :
6
fYear :
2004
fDate :
6/1/2004 12:00:00 AM
Firstpage :
1450
Lastpage :
1452
Abstract :
We have investigated an Mg-doped InxOy(MIO)-Ag scheme for the formation of high-quality ohmic contacts to p-type GaN for flip-chip light-emitting diodes (LEDs). The as-deposited sample shows nonlinear current-voltage (I--V) characteristics. However, annealing the contacts at temperatures of 330°C-530°C for 1 min in air ambient results in linear I--V behaviors, producing specific contact resistances of 10-4--10-5 Ω·cm2. In addition, blue LEDs fabricated with the MIO-Ag contact layers give forward-bias voltages of 3.13-3.15 V at an injection current of 20 mA. It is further shown that LEDs made with the MIO-Ag contact layers give higher output power compared with that with the Ag contact layer. This result strongly indicates that the MIO-Ag can be a promising scheme for the realization of high brightness LEDs for solid-state lighting application.
Keywords :
III-V semiconductors; annealing; contact resistance; gallium compounds; indium compounds; light emitting diodes; magnesium; ohmic contacts; silver; 1 min; 20 mA; 3.13 to 3.15 V; 330 to 530 degC; GaN; InxOy:Mg-Ag; MIO-Ag contact layers; Mg-doped indium oxide-Ag contacts; annealing; contact resistances; flip-chip light-emitting diodes; high brightness LED; ohmic contacts; reflective contacts; Annealing; Brightness; Contact resistance; Gallium nitride; Indium; Light emitting diodes; Ohmic contacts; Power generation; Temperature; Voltage;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2004.827096
Filename :
1300628
Link To Document :
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