Determination of back-scatter coefficient from third-order Rayleigh effect in a Raman amplifier

Author

Park, Jonghan ; Kim, Na Young ; Choi, Wonsub ; Lee, Hansuek ; NamKyoo Park

Author_Institution

Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., South Korea

Volume

16

Issue

6

fYear

2004

fDate

6/1/2004 12:00:00 AM

Firstpage

1459

Lastpage

1461

Abstract

We propose a precise measurement technique for the Rayleigh back-scattering coefficient based on a single-ended optical time-domain reflectometry trace analysis. By comparing the relative strength of the Rayleigh components-Rayleigh scattering and triple Rayleigh scattering-we show that it is possible to avoid the uncertainties associated with previous measurement techniques, achieving less than 0.1-dB error in the determination of the Rayleigh coefficient. Application of this technique to the noise characterization of the fiber Raman amplifiers will be provided at the end.

Keywords

Raman lasers; Rayleigh scattering; backscatter; laser noise; measurement errors; optical fibre amplifiers; optical fibre testing; optical time-domain reflectometry; Raman amplifier; Rayleigh backscattering; Rayleigh scattering; backscatter coefficient; fiber Raman amplifiers; noise characterization; optical time-domain reflectometry; third-order Rayleigh effect; Optical amplifiers; Optical attenuators; Optical noise; Optical scattering; Power measurement; Pulse measurements; Raman scattering; Rayleigh scattering; Stimulated emission; US Department of Transportation;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2004.827105

Filename

1300631