• DocumentCode
    990884
  • Title

    Algorithms and models for cellular based topography simulation

  • Author

    Strasser, Ernst ; Selberherr, Siegfried

  • Author_Institution
    Inst. for Microelectronics, Tech. Univ. Wien, Austria
  • Volume
    14
  • Issue
    9
  • fYear
    1995
  • fDate
    9/1/1995 12:00:00 AM
  • Firstpage
    1104
  • Lastpage
    1114
  • Abstract
    A general simulation method for three-dimensional surface advancement has been developed and coupled with physical models for etching and deposition. The surface advancement algorithm is based on morphological operations derived from image processing which are performed on a cellular material representation. This method allows arbitrary changes of the actual geometry according to a precalculated etch or deposition rate distribution and can support very complex structures with tunnels or regions of material which are completely disconnected from other regions. Surface loops which result from a growing or etching surface intersecting with itself are inherently avoided. The etch or deposition rate distribution along the exposed surface is obtained from macroscopic point advancement models which consider information about flux distributions and surface reactions of directly and indirectly incident particles
  • Keywords
    digital simulation; etching; lithography; semiconductor process modelling; surface topography; cellular based topography simulation; cellular material representation; deposition rate distribution; etch rate distribution; flux distributions; macroscopic point advancement models; morphological operations; physical models; surface reactions; three-dimensional surface advancement; Anisotropic magnetoresistance; Biological materials; Circuit simulation; Computational modeling; Etching; Morphological operations; Shape; Solid modeling; Surface morphology; Surface topography;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.406712
  • Filename
    406712