• DocumentCode
    991245
  • Title

    Impact of Halo Doping on the Subthreshold Performance of Deep-Submicrometer CMOS Devices and Circuits for Ultralow Power Analog/Mixed-Signal Applications

  • Author

    Chakraborty, Saurav ; Mallik, Abhijit ; Sarkar, Chandan Kumar ; Rao, V. Ramgopal

  • Author_Institution
    Simplex Infrastructures Ltd, Kolkata
  • Volume
    54
  • Issue
    2
  • fYear
    2007
  • Firstpage
    241
  • Lastpage
    248
  • Abstract
    In addition to its attractiveness for ultralow power applications, analog CMOS circuits based on the subthreshold operation of the devices are known to have significantly higher gain as compared to their superthreshold counterpart. The effects of halo [both double-halo (DH) and single-halo or lateral asymmetric channel (LAC)] doping on the subthreshold analog performance of 100-nm CMOS devices are systematically investigated for the first time with extensive process and device simulations. In the subthreshold region, although the halo doping is found to improve the device performance parameters for analog applications (such as gm/Id, output resistance and intrinsic gain) in general, the improvement is significant in the LAC devices. Low angle of tilt of the halo implant is found to give the best improvement in both the LAC and DH devices. Our results show that the CMOS amplifiers made with the halo implanted devices have higher voltage gain over their conventional counterpart, and a more than 100% improvement in the voltage gain is observed when LAC doping is made on both the p- and n-channel devices of the amplifier
  • Keywords
    CMOS integrated circuits; analogue integrated circuits; doping profiles; low-power electronics; mixed analogue-digital integrated circuits; CMOS amplifiers; CMOS circuits; deep-submicrometer CMOS devices; halo doping; halo implanted devices; lateral asymmetric channel doping; subthreshold performance; ultralow power analog/mixed-signal applications; voltage gain; Analog circuits; CMOS analog integrated circuits; CMOS digital integrated circuits; CMOS technology; DH-HEMTs; Doping; Los Angeles Council; MOSFETs; Performance gain; Voltage; CMOS; halo; lateral asymmetric channel (LAC); mixed-signal; subthreshold; ultralow power;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2006.888630
  • Filename
    4067173