DocumentCode
991269
Title
Observations on Component Infant Mortality and Burn-In Effectiveness
Author
Cooper, Mark
Author_Institution
Jet Propulsion Labs., California Inst. of Technol., Pasadena, CA
Volume
31
Issue
4
fYear
2008
Firstpage
914
Lastpage
916
Abstract
The following concepts are discussed: burn-in effectiveness, component failure distributions, early life distribution, early life failures, infant mortality.
Keywords
Weibull distribution; packaging; reliability theory; shielding; burn-in effectiveness; component failure distributions; component infant mortality; early life distribution; early life failures; Acceleration; Electronic components; Electronic switching systems; Hazards; Integrated circuit reliability; Life testing; Manufacturing; Missiles; Stress; Temperature; Burn-in effectiveness; component failure distributions; early life distribution; early life failures; infant mortality;
fLanguage
English
Journal_Title
Components and Packaging Technologies, IEEE Transactions on
Publisher
ieee
ISSN
1521-3331
Type
jour
DOI
10.1109/TCAPT.2008.2007187
Filename
4675666
Link To Document