Title :
Observations on Component Infant Mortality and Burn-In Effectiveness
Author_Institution :
Jet Propulsion Labs., California Inst. of Technol., Pasadena, CA
Abstract :
The following concepts are discussed: burn-in effectiveness, component failure distributions, early life distribution, early life failures, infant mortality.
Keywords :
Weibull distribution; packaging; reliability theory; shielding; burn-in effectiveness; component failure distributions; component infant mortality; early life distribution; early life failures; Acceleration; Electronic components; Electronic switching systems; Hazards; Integrated circuit reliability; Life testing; Manufacturing; Missiles; Stress; Temperature; Burn-in effectiveness; component failure distributions; early life distribution; early life failures; infant mortality;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/TCAPT.2008.2007187
