• DocumentCode
    991269
  • Title

    Observations on Component Infant Mortality and Burn-In Effectiveness

  • Author

    Cooper, Mark

  • Author_Institution
    Jet Propulsion Labs., California Inst. of Technol., Pasadena, CA
  • Volume
    31
  • Issue
    4
  • fYear
    2008
  • Firstpage
    914
  • Lastpage
    916
  • Abstract
    The following concepts are discussed: burn-in effectiveness, component failure distributions, early life distribution, early life failures, infant mortality.
  • Keywords
    Weibull distribution; packaging; reliability theory; shielding; burn-in effectiveness; component failure distributions; component infant mortality; early life distribution; early life failures; Acceleration; Electronic components; Electronic switching systems; Hazards; Integrated circuit reliability; Life testing; Manufacturing; Missiles; Stress; Temperature; Burn-in effectiveness; component failure distributions; early life distribution; early life failures; infant mortality;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2008.2007187
  • Filename
    4675666