Title :
Thermal Challenges in Next-Generation Electronic Systems
Author :
Garimella, Suresh V. ; Fleischer, Amy S. ; Murthy, Jayathi Y. ; Keshavarzi, Ali ; Prasher, Ravi ; Patel, Chandrakant ; Bhavnani, Sushil H. ; Venkatasubramanian, R. ; Mahajan, Ravi ; Joshi, Y. ; Sammakia, Bahgat ; Myers, Bruce A. ; Chorosinski, Len ; Baelm
Author_Institution :
Dept. of Mech. Eng., Purdue Univ., West Lafayette, IN
Abstract :
Thermal challenges in next-generation electronic systems, as identified through panel presentations and ensuing discussions at the workshop, Thermal Challenges in Next Generation Electronic Systems, held in Santa Fe, NM, January 7-10, 2007, are summarized in this paper. Diverse topics are covered, including electrothermal and multiphysics codesign of electronics, new and nanostructured materials, high heat flux thermal management, site-specific thermal management, thermal design of next-generation data centers, thermal challenges for military, automotive, and harsh environment electronic systems, progress and challenges in software tools, and advances in measurement and characterization. Barriers to further progress in each area that require the attention of the research community are identified.
Keywords :
cooling; thermal management (packaging); electrothermal codesign; high heat flux thermal management; multiphysics codesign; nanostructured materials; next-generation data centers; next-generation electronic systems; site-specific thermal management; software tools; Conferences; Electrothermal effects; Environmental management; Iron; Mechanical engineering; Nanostructured materials; Software tools; Thermal management; Thermal management of electronics; Thermal resistance; Electronics cooling; thermal management; trends;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/TCAPT.2008.2001197