• DocumentCode
    991333
  • Title

    Thermal Challenges in Next-Generation Electronic Systems

  • Author

    Garimella, Suresh V. ; Fleischer, Amy S. ; Murthy, Jayathi Y. ; Keshavarzi, Ali ; Prasher, Ravi ; Patel, Chandrakant ; Bhavnani, Sushil H. ; Venkatasubramanian, R. ; Mahajan, Ravi ; Joshi, Y. ; Sammakia, Bahgat ; Myers, Bruce A. ; Chorosinski, Len ; Baelm

  • Author_Institution
    Dept. of Mech. Eng., Purdue Univ., West Lafayette, IN
  • Volume
    31
  • Issue
    4
  • fYear
    2008
  • Firstpage
    801
  • Lastpage
    815
  • Abstract
    Thermal challenges in next-generation electronic systems, as identified through panel presentations and ensuing discussions at the workshop, Thermal Challenges in Next Generation Electronic Systems, held in Santa Fe, NM, January 7-10, 2007, are summarized in this paper. Diverse topics are covered, including electrothermal and multiphysics codesign of electronics, new and nanostructured materials, high heat flux thermal management, site-specific thermal management, thermal design of next-generation data centers, thermal challenges for military, automotive, and harsh environment electronic systems, progress and challenges in software tools, and advances in measurement and characterization. Barriers to further progress in each area that require the attention of the research community are identified.
  • Keywords
    cooling; thermal management (packaging); electrothermal codesign; high heat flux thermal management; multiphysics codesign; nanostructured materials; next-generation data centers; next-generation electronic systems; site-specific thermal management; software tools; Conferences; Electrothermal effects; Environmental management; Iron; Mechanical engineering; Nanostructured materials; Software tools; Thermal management; Thermal management of electronics; Thermal resistance; Electronics cooling; thermal management; trends;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2008.2001197
  • Filename
    4675673