DocumentCode
991657
Title
Measurement of magnetocrystalline anisotropy field and magnetostriction coefficient in garnet films
Author
Wang, X. ; Krafft, C.S. ; Kryder, M.H.
Author_Institution
Carnegie-Mellon University, Pittsburgh, PA.
Volume
18
Issue
6
fYear
1982
fDate
11/1/1982 12:00:00 AM
Firstpage
1295
Lastpage
1297
Abstract
We report here on improvements to standard techniques for the measurement of the effective uniaxial anisotropy field HKE = HK -4πMs , the magnetocrystalline anisotropy field H1 , and the magnetostriction coefficient λ111 . Measurements were made on full wafer garnets in a wideband resonance spectrometer with a nonresonant microstrip transmission line, Advantages of this technique include higher sensitivity than a previously reported microstrip structure [1], no problems with coupled resonances in λ111 measurements, as was reported by Vella-Coleiro [2] with a shorted waveguide, and ability to measure H1 on full wafer garnets, in contrast to use of a resonant cavity [3] which requires dicing the wafer into small chips. In the H1 calculation, the deviation of the magnetization from the applied field direction is considered. Accuracy of H1 is better than ±10 Oe. A graphical method for determining H1 is presented. Results on different material compositions which support 1 μm and 0.5 μm diameter bubbles are reported.
Keywords
Magnetic anisotropy; Magnetic bubble films; Anisotropic magnetoresistance; Garnet films; Magnetic anisotropy; Magnetic field measurement; Magnetic resonance; Magnetostriction; Microstrip; Perpendicular magnetic anisotropy; Semiconductor device measurement; Transmission line measurements;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1982.1062154
Filename
1062154
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