• DocumentCode
    991657
  • Title

    Measurement of magnetocrystalline anisotropy field and magnetostriction coefficient in garnet films

  • Author

    Wang, X. ; Krafft, C.S. ; Kryder, M.H.

  • Author_Institution
    Carnegie-Mellon University, Pittsburgh, PA.
  • Volume
    18
  • Issue
    6
  • fYear
    1982
  • fDate
    11/1/1982 12:00:00 AM
  • Firstpage
    1295
  • Lastpage
    1297
  • Abstract
    We report here on improvements to standard techniques for the measurement of the effective uniaxial anisotropy field HKE= HK-4πMs, the magnetocrystalline anisotropy field H1, and the magnetostriction coefficient λ111. Measurements were made on full wafer garnets in a wideband resonance spectrometer with a nonresonant microstrip transmission line, Advantages of this technique include higher sensitivity than a previously reported microstrip structure [1], no problems with coupled resonances in λ111measurements, as was reported by Vella-Coleiro [2] with a shorted waveguide, and ability to measure H1on full wafer garnets, in contrast to use of a resonant cavity [3] which requires dicing the wafer into small chips. In the H1calculation, the deviation of the magnetization from the applied field direction is considered. Accuracy of H1is better than ±10 Oe. A graphical method for determining H1is presented. Results on different material compositions which support 1 μm and 0.5 μm diameter bubbles are reported.
  • Keywords
    Magnetic anisotropy; Magnetic bubble films; Anisotropic magnetoresistance; Garnet films; Magnetic anisotropy; Magnetic field measurement; Magnetic resonance; Magnetostriction; Microstrip; Perpendicular magnetic anisotropy; Semiconductor device measurement; Transmission line measurements;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1982.1062154
  • Filename
    1062154