Title :
Screening method for laser diodes with high reliability
Author :
Nakano, Yoshiaki ; Iwane, G. ; Ikegami, Tomoaki
Author_Institution :
NTT Atsugi Electrical Communication Laboratory, Atsugi, Japan
Abstract :
Selection after aging for a few thousand hours at 70°C, following an initial hard screening, is proposed as a practical way to pick up reliable devices for undersea transmission systems.
Keywords :
ageing; electron device testing; optical communication equipment; reliability; semiconductor junction lasers; Weibull plot; aging; double channel planar BH lasers; hard screening; high reliability; laser diodes; semiconductor junction lasers; undersea transmission systems;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19840275
