• DocumentCode
    991823
  • Title

    Screening method for laser diodes with high reliability

  • Author

    Nakano, Yoshiaki ; Iwane, G. ; Ikegami, Tomoaki

  • Author_Institution
    NTT Atsugi Electrical Communication Laboratory, Atsugi, Japan
  • Volume
    20
  • Issue
    10
  • fYear
    1984
  • Firstpage
    397
  • Lastpage
    398
  • Abstract
    Selection after aging for a few thousand hours at 70°C, following an initial hard screening, is proposed as a practical way to pick up reliable devices for undersea transmission systems.
  • Keywords
    ageing; electron device testing; optical communication equipment; reliability; semiconductor junction lasers; Weibull plot; aging; double channel planar BH lasers; hard screening; high reliability; laser diodes; semiconductor junction lasers; undersea transmission systems;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19840275
  • Filename
    4248722
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=991823