Title :
Parallel-to-serial transformation by using large-cell-size amorphous-silicon charge-coupled devices
Author :
Uchida, Yasuo ; Kishida, Satoru ; Matsumura, Mieko
Author_Institution :
Tokyo Institute of Technology, Department of Physical Electronics, Tokyo, Japan
Abstract :
An 8 bit/mm amorphous-silicon charge-coupled device of resistive gate structure and amorphous-silicon transistors has been integrated in monolithic form. The device operated at 10 kHz with a transfer efficiency of more than 99.4% per transfer. Parallel signals applied from external terminals have been transferred to cells in the charge-coupled device under the control of transistors, and have been detected as serial signals at the output terminal of the charge-coupled device.
Keywords :
amorphous semiconductors; charge-coupled device circuits; image sensors; silicon; Si; amorphous semiconductors; charge-coupled device; image sensors; parallel-to-serial transformation; resistive gate structure; transfer efficiency;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19840292