DocumentCode :
992137
Title :
Lasing Mode Hysteresis Characteristics in Semiconductor Ring Lasers
Author :
Born, Chris ; Yuan, Guohui ; Wang, Zhuoran ; Sorel, Marc ; Yu, Siyuan
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Bristol, Bristol
Volume :
44
Issue :
12
fYear :
2008
Firstpage :
1171
Lastpage :
1179
Abstract :
Wavelength and directional hysteresis due to increasing and decreasing current and temperature have been investigated. Measurements indicate that lasing direction hysteresis associated with changes in injection current can be attributed to the resulting shift in the linear gain peak which is due to the change in device temperature. Interaction between the linear gain spectrum and the asymmetric nonlinear gain spectrum results in contrasting behavior for increasing and decreasing temperature and current. The phenomena are modeled using a nonlinear time domain model including the carrier density pulsation (CDP), carrier heating (CH) and spectral hole burning (SHB) effects. The numerically reproduced hysteresis loop is in close agreement to the experimental observation. Our work further shows that mode hops to longer wavelength non lasing modes are quicker than those to shorter wavelength lasing modes due to the lack of four wave mixing (FWM) mode coupling in the non-lasing mode. The same model can be used to study the dynamics during switching of lasing directions triggered by other means, such as optical injection.
Keywords :
carrier density; laser cavity resonators; laser modes; laser theory; multiwave mixing; optical hole burning; ring lasers; semiconductor device measurement; semiconductor device models; semiconductor lasers; time-domain analysis; FWM mode coupling; asymmetric nonlinear gain spectrum; carrier density pulsation; carrier heating; four wave mixing; injection current; lasing direction hysteresis measurement; lasing mode hysteresis characteristics; lasing wavelength hysteresis measurement; linear gain spectrum; nonlinear time domain model; semiconductor ring lasers; spectral hole burning; Charge carrier density; Current measurement; Gain measurement; Heating; Hysteresis; Laser modes; Ring lasers; Semiconductor lasers; Temperature; Wavelength measurement; Microring; mode hysteresis; multi-mode rate equation; semiconductor lasers; semiconductor ring laser;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2008.2003148
Filename :
4675821
Link To Document :
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