DocumentCode :
992241
Title :
Uncertainty analysis of the CISPR/a radiated emission round-robin test results
Author :
Goedbloed, Jasper J. ; Beeckman, Pierre A.
Author_Institution :
Philips Res., Eindhoven, Netherlands
Volume :
46
Issue :
2
fYear :
2004
fDate :
5/1/2004 12:00:00 AM
Firstpage :
246
Lastpage :
262
Abstract :
A large round-robin test (RRT) was carried out to obtain quantitative information about the uncertainties that play a role in an International Electrotechnical Commission/International Special Committee on Radio Interference (IEC/CISPR) radiated emission test in the frequency range 30 to 300 MHz. Two different equipment under tests (EUTs) allowed us to distinguish between the measurement instrumentation and the EUT-induced uncertainties, a subset of the standards compliance uncertainties. This paper presents the rationale behind the various RRT-measurements, the way the ancillary equipment was continuously checked, the measurement results and the results of their statistical analysis. The test sites included open-area test-sites, semi-anechoic rooms and fully anechoic rooms. A major conclusion is that measurement instrumentation uncertainty considerations alone cannot explain the uncertainty relevant in an actual CISPR radiated emission compliance test.
Keywords :
anechoic chambers (electromagnetic); measurement uncertainty; open area test sites; radiofrequency interference; statistical analysis; test equipment; 30 to 300 MHz; International Electrotechnical Commission; International Special Committee on Radio Interference; open-area test-sites; radiated emission compliance test; round-robin test; standards compliance uncertainties; statistical analysis; uncertainty analysis; Antenna measurements; Cables; Current measurement; Electromagnetic compatibility; IEC; Instruments; Measurement uncertainty; Open area test sites; Statistical analysis; Testing; Radiated emission; standardization; uncertainty analysis;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2004.826892
Filename :
1300764
Link To Document :
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